A highly sophisticated electro-optical analyzing system, which is used to analyze the properties of
each parameter needed to define the cut grade of a stone added to the newly introduced GIA Facet Ware. With a basic measurement
accuracy of 0.015 mm, when applicable, the properties are measured and analyzed separately for each and every facet, and
results are shown in millimeters and percentage, displaying the options to improve the stone. This system includes a mark-upon
option, and can also be used (along with an appropriate software) to analyze rough diamonds in order to get maximum yield.
Generally the obtained data helps the gemologist be more decisive in determining the value of a stone.